Stock Code 688601

Quality Policy

  • Standard Management

  • Ensure the High Quality of IC Products

  • Continuously Enhance Customer Satisfaction

  • Well-designed

  • Pioneering and Innovative

  • Strict Control

Environmental Policy

  • Prevent Environmental Pollution

  • Improve Environmental Management Effects

  • Strengthen Environmental Awareness

  • Promote to Employees and Public

  • Compliance with Environmental Reguations

  • Ensure Environmental Management Meet Standards

System Certificate

  • ISO 9001:2015 Certification

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  • ISO 14001:2015 Environmental Management Certification

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  • CNAS Laboratory Accreditation (ISO/IEC 17025)

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  • ISO 26262:2018 Functional Safety Certification (ASIL-D for Automotive Electronics)

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Introduction of the Experimental Center

Items and condition

Items Abbreviation Condition
Pre-Condition Pre-C Step 1: Test
Step 2: Baking => 125°C, 24hrs
Step 3: THT: time and condition based on MSL level
Step 4: Reflow : 260°C, 3 times
Step 5: 22-SAT IPC/JEDECJ-STD-035
Step 6: Test
High Temperature Operating Life Test HTOL 125°C,VDD=AMR*90%,1000hrs
High Accelerated Stress Test HAST 130°C, 85%R.H., 168hrs
High Temperature Storage Test HTST 150°C, 1000hrs.
Low Temperature Operating Life Test LTOL -40°C,VDD=AMR*90%, 1000hrs.
Temperature Humidity Operation Test Aging 85°C,85%R.H.VDD=AMR*90%,1000hrs
Thermal Shock Test TST -65°C ~ 150°C, Dwell=15min ; 500Cycles
Pressure Cook Test PCT 121°C, 100%R.H. 96hrs
Board level Temperature Cycling Test BLTC -65°C ~ 150°C, Dwell=1min, 500Cycles, Linear temperature =13°C/min
Drop Test DT 1.5g, 0.5ms, 90drops
Vibration Test VFV Frequency : 35Hz
Solder ability SD Steam Aging 8H, Solder 245°C, 10S
Early Life Failure Rate ELFR 125°C, VDD=AMR*90%, 48hrs

Equipment information

Model:EHS-212M

Item:HAST

Q'ty:2

Model:PC-422R8

Item:HAST

Q'ty:1

Model:HV-25II

Item:PCT

Q'ty:1

Model:EHS-212M

Item:HAST

Q'ty:2

Model:PC-422R8

Item:HAST

Q'ty:1

Model:HV-25II

Item:PCT

Q'ty:1

Reliability

Relevant reliability assessment items and standards

Test Item Item Condition Sampling Size/Acc Frequency
Pre - Condition IR "Baking: 125°C,24hrs THT; Time and conditions per IPC/JEDEC J-STD-020 based on device MSL level Reflow: 260°C, 3times" 77/7/0 New Item
Reflow IR 260°C, 3times 77/0 By lot
High Accelerated Stress Test HAST 130°C,85%R.H, 96/168hrs 77/0 By lot
Thermal Shock Test TST -65°C~150°C,100/500Cycles, Dwell=15min 77/0 By lot
High Temperature StorageTest HTST 150°C,168/500/1000hrs. 22/0 Monthly
High Temperature Operating Life Test HTOL 125°C, VDD=AMR*90%,168/500/1000hrs 22/0 Monthly
Low Temperature Operating Life Test LTOL -40°C, VDD=AMR*90%, 168/500/1000hrs 22/0 Monthly
Temperature Humidity Storage Test Aging 85°C,85%R.H.VDD=AMR*90%, 168/500/1000hrs 22/0 Monthly
Pressure Cook Test PCT 121°C, 100%R.H.2 atms, 96hrs 22/0 Monthly

Failure Analysis

  • Failure Analysis Process Flow
  • Failure Analysis Techniques & Capabilities

Our structured failure analysis process ensures thorough investigation and accurate root cause identification to resolve customer issues and improve product quality.

Process Phase Responsible Party Key Actions
Customer Complaint Handling QA
  • Establish the FA team.
  • Verify complaint details.
  • Collect detailed failure phenomenon.
  • Confirm accurate failure rate.
  • Identify failure stage (Engineering, Mass Production, Market).
  • Obtain necessary application forms from the customer.
Lot History Tracking QA
  • Review inline data (Foundry & Assembly). Investigate any process abnormalities.
  • Examine shipping history.
  • Review storage conditions.
Visual Inspection QA
  • Verify component marking information.
  • Inspect all external surfaces.
  • Examine solder ball appearance.
OS & Application Test FAE
  • Confirm electrical performance specifications.
  • Verify functional operation.
  • Reproduce the failure phenomenon as reported by the customer.
Final Test (FT) Analysis Test Engineering
  • Execute FT a minimum of 5 times, recording data logs.
  • If bench failure occurs but ATE passes, evaluate test coverage.
  • Identify and mark failing parameters.
  • Analyze new test data for the specific lot.
Emission Microscopy (EMMI) R&D
  • Detect and locate abnormal emission points (e.g., leakage, hot carriers).
Decapsulation & Delayer R&D
  • Physically expose the die and internal layers.
  • Correlate observed abnormalities with layout and schematic.
  • Determine if the abnormal area is related to the failure.
  • Assess if the failure indicates a potential design issue.
Failure Duplication & Root Cause Verification FAE
R&D
  • Simulate the failure phenomenon under controlled conditions.
  • Verify the hypothesized root cause.
FA Report & Corrective Actions FAE
R&D
QA
  • Summarize the identified root cause.
  • Define corrective and preventive actions (CAPA).
  • Establish standardized processes to prevent recurrence.

We utilize a comprehensive suite of advanced analytical techniques to diagnose failures at various levels

Bulleted List:

  • Appearance Inspection
  • Final Test (FT) Verification
  • Electrical Characterization / Curve Tracing
  • X-Ray Inspection (X-Ray)
  • Scanning Acoustic Tomography (SAT / C-SAM)
  • Decapsulation (De-cap)
  • Wire Bond Pull Test
  • Solder Ball Shear Test
  • Cross-Sectional Analysis (Cross-section)
  • Layer-by-Layer Deprocessing (De-layer)
  • Emission Microscopy (EMMI)
  • Optical Beam Induced Resistance Change (OBIRCH)
  • Focused Ion Beam (FIB) Circuit Edit & Analysis

Green Manufacturing

  • 01.

    The noise emission is up to the standard, in line with the standard III of GB12348 "Noise Standard for Industrial Enterprise Boundary";

  • 02.

    The treatment of solid hazardous waste meets the requirements of laws and regulations;

  • 03.

    Ensure that the company's products and purchase products harmful chemical substances (lead, cadmium, mercury, chromium six dielectric) 100% is not exceeded the standard;

  • 04.

    Ensure that the company's products and purchased products do not contain conflict metals such as gold (Au), tantalum (Ta), tungsten (W) and tin (Sn) produced by minerals in conflict areas;

  • 05.

    Domestic sewage management meets regulations;

  • 06.

    The fire incidence rate is 0.

Conflict-Free Minerals Policy

Conflict minerals refer to Metal minerals such as gold (Au), tantalum (Ta), tungsten (W), cobalt (Co), tin (Sn) and other metals produced from Congo and surrounding 10 countries (DR Congo, Ganga, Sudan, Rwanda, Burundi, Uganda, Zambia, Angola, Tanzania, Central African Republic), through smuggling trade channels, by non-governmental military groups or non-military factions in the controlled conflict area. ETEK prohibits use of metals from conflict mining areas;

Prohibit the procurement and use of conflict metal raw materials produced in mining areas in conflict areas;

Ensure that products do not use "conflict minerals" from conflict areas;

Communicate this requirement to its upstream suppliers.